XT V 130C - Cost-effective X-ray inspection

The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130 kV/10 W Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high resolution imaging chain. A series of optional factory or field upgrades enable the users to configure the system to their own requirements and budget. Upgrades include a sample rotation stage, a high definition digital flat panel option, automated inspection software and CT technology

Features

• Proprietary 130 kV / 10W microfocus source with 2 μm feature recognition
• 1.45 Mpixel 12bit camera with 6” image intensifier
• 4-axis manipulator (X, Y, Z, Tilt)
• Primarly focusing on real-time imaging

FOCUS ON PRODUCTIVITY

• Fast automated component inspection with immediate analysis and reporting
• Load position for quick and easy loading/unloading of sample
• Large door with automatic interlocked X-ray off function provides easy access to the
inspection area
• Large tray to load multiple boards
• Barcode reader for automatic recognition of specimen serial number (optional)

 LOW COST OF OWNERSHIP
• Unlimited source life time due to open tube design with user replacable low cost
filaments
• Serviceable components are easily accessible
• Integrated source requires no high voltage cable
• No special floor treatment required

SAFETY AS A DESIGN CRITERION
• Continuous fail-to-safe monitoring
• Full protective enclosure requires no special badges or protective clothing
• Lead-lined cabinet fully complies to DIN 54113 radiation safety standards and CE
regulation